Title :
Formal meaning of coverage metrics in simulation-based hardware design verification
Author :
Ugarte, I. ; Sanchez, P.
Author_Institution :
Dept. of TEISA, Cantabria Univ., Santander, Spain
fDate :
30 Nov.-2 Dec. 2005
Abstract :
As the latest version of the International Technology Roadmap for Semiconductors highlights, verification has become the dominant cost of the electronic system design process. Although advances in formal methods have improved some aspects of the task, software simulation remains the primary method of functional verification. Traditionally, heuristic coverage metrics have been used to evaluate the simulation-based validation process and the development of coverage-driven random-based test bench generation techniques is allowing the automation of the functional verification process. This coverage-based approach has a very serious disadvantage: the metrics have no formal meaning and so there is no direct correlation between classes of bugs and coverage metrics. The main goal of this paper is to explore methods that provide a formal meaning to coverage metrics with random test benches. They are independent of a particular fault or bug model. The methods are based on polynomial models of the system under verification and they can evaluate data and control statements.
Keywords :
electronic engineering computing; integrated circuit testing; coverage-driven test generation; electronic system design; formal meaning; formal methods; functional verification; hardware design verification; heuristic coverage metrics; polynomial models; random test benches; software simulation; test bench generation; Automatic control; Automatic testing; Automation; Computer bugs; Costs; Design engineering; Hardware; Microelectronics; Polynomials; Process design;
Conference_Titel :
High-Level Design Validation and Test Workshop, 2005. Tenth IEEE International
Print_ISBN :
0-7803-9571-9
DOI :
10.1109/HLDVT.2005.1568841