DocumentCode
2911256
Title
Combining multiobjective fuzzy clustering and probabilistic ANN classifier for unsupervised pattern classification: Application to satellite image segmentation
Author
Mukhopadhyay, Anirban ; Bandyopadhyay, Sanghamitra ; Maulik, Ujjwal
Author_Institution
Dept. of Comput. Sci. & Eng., Univ. of Kalyani, Kalyani
fYear
2008
fDate
1-6 June 2008
Firstpage
877
Lastpage
883
Abstract
An important approach to unsupervised pixel classification in remote sensing satellite imagery is to use clustering in the spectral domain. In this article, a recently proposed multiobjective fuzzy clustering scheme has been combined with artificial neural networks (ANN) based probabilistic classifier to yield better performance. The multiobjective technique is first used to produce a set of non-dominated solutions. A part of these solutions having high confidence level are then used to train the ANN classifier. Finally the remaining solutions are classified using the trained classifier. The performance of this technique has been compared with that of some other well- known algorithms for two artificial data sets and a IRS satellite image of the city of Calcutta.
Keywords
artificial intelligence; geophysical signal processing; image segmentation; neural nets; pattern classification; pattern clustering; remote sensing; Calcutta city; IRS satellite image; artificial data sets; artificial neural networks; multiobjective fuzzy clustering; probabilistic ANN classifier; remote sensing satellite imagery; satellite image segmentation; unsupervised pattern classification; Artificial neural networks; Cities and towns; Clustering algorithms; Computer science; Image segmentation; Partitioning algorithms; Pattern classification; Pixel; Remote sensing; Satellites; ANN classifier; Fuzzy clustering; Pareto-optimality; cluster validity measures; multiobjective; optimization; remote sensing satellite imagery;
fLanguage
English
Publisher
ieee
Conference_Titel
Evolutionary Computation, 2008. CEC 2008. (IEEE World Congress on Computational Intelligence). IEEE Congress on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-1822-0
Electronic_ISBN
978-1-4244-1823-7
Type
conf
DOI
10.1109/CEC.2008.4630899
Filename
4630899
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