• DocumentCode
    2911277
  • Title

    A Global Test Point Placement Algorithm of Combinational Circuits

  • Author

    Xiang, Dong ; Wei, Daozheng ; Chen, Shisong

  • Author_Institution
    Institute of Computing Technology, Academia Sinica
  • fYear
    1992
  • fDate
    4-7 Jan 1992
  • Firstpage
    227
  • Lastpage
    232
  • Keywords
    Circuit faults; Circuit testing; Combinational circuits; Computers; Design for testability; Digital circuits; Electrical fault detection; Fault detection; Laboratories; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1992. Proceedings., The Fifth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-2465-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1992.658052
  • Filename
    658052
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2911277