DocumentCode :
2911277
Title :
A Global Test Point Placement Algorithm of Combinational Circuits
Author :
Xiang, Dong ; Wei, Daozheng ; Chen, Shisong
Author_Institution :
Institute of Computing Technology, Academia Sinica
fYear :
1992
fDate :
4-7 Jan 1992
Firstpage :
227
Lastpage :
232
Keywords :
Circuit faults; Circuit testing; Combinational circuits; Computers; Design for testability; Digital circuits; Electrical fault detection; Fault detection; Laboratories; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-2465-5
Type :
conf
DOI :
10.1109/ICVD.1992.658052
Filename :
658052
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2911277
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