• DocumentCode
    2911433
  • Title

    Computational Complexity of Test-Point Insertions and Decompositions

  • Author

    Rao, N.S.V. ; Toida, S.

  • Author_Institution
    Old Dominion University
  • fYear
    1992
  • fDate
    4-7 Jan 1992
  • Firstpage
    233
  • Lastpage
    238
  • Keywords
    Circuit testing; Combinational circuits; Computational complexity; Computer science; Controllability; Design for testability; Logic testing; Minimization methods; Observability; Polynomials;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Design, 1992. Proceedings., The Fifth International Conference on
  • ISSN
    1063-9667
  • Print_ISBN
    0-8186-2465-5
  • Type

    conf

  • DOI
    10.1109/ICVD.1992.658053
  • Filename
    658053
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2911433