DocumentCode :
2911433
Title :
Computational Complexity of Test-Point Insertions and Decompositions
Author :
Rao, N.S.V. ; Toida, S.
Author_Institution :
Old Dominion University
fYear :
1992
fDate :
4-7 Jan 1992
Firstpage :
233
Lastpage :
238
Keywords :
Circuit testing; Combinational circuits; Computational complexity; Computer science; Controllability; Design for testability; Logic testing; Minimization methods; Observability; Polynomials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
ISSN :
1063-9667
Print_ISBN :
0-8186-2465-5
Type :
conf
DOI :
10.1109/ICVD.1992.658053
Filename :
658053
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2911433
