DocumentCode
2911516
Title
Reliable Communications Using FPGAs in High-Radiation Environments - Part I: Characterization
Author
Pratt, Brian ; Fuller, Megan ; Rice, Michael ; Wirthlin, Michael
Author_Institution
Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
fYear
2010
fDate
23-27 May 2010
Firstpage
1
Lastpage
5
Abstract
Reconfigurable radios implemented on FPGAs operating in high-radiation environments are subject to single-event- upsets (SEUs). The traditional mitigation method of applying triple modular redundancy (TMR) to the entire design does not have to be used in this application. This is because the majority of the SEUs impact the overall performance (measured by bit error rate) in the same way additive noise does. The results of this paper show which sections must be protected from SEUs and provide a guide for the bit error rate performance versus FPGA area tradeoff as a function of SEU mitigation.
Keywords
Additive noise; Bit error rate; Circuits; Field programmable gate arrays; Hardware; Peer to peer computing; Protection; Redundancy; Single event transient; Single event upset;
fLanguage
English
Publisher
ieee
Conference_Titel
Communications (ICC), 2010 IEEE International Conference on
Conference_Location
Cape Town, South Africa
ISSN
1550-3607
Print_ISBN
978-1-4244-6402-9
Type
conf
DOI
10.1109/ICC.2010.5502571
Filename
5502571
Link To Document