• DocumentCode
    2911516
  • Title

    Reliable Communications Using FPGAs in High-Radiation Environments - Part I: Characterization

  • Author

    Pratt, Brian ; Fuller, Megan ; Rice, Michael ; Wirthlin, Michael

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Brigham Young Univ., Provo, UT, USA
  • fYear
    2010
  • fDate
    23-27 May 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Reconfigurable radios implemented on FPGAs operating in high-radiation environments are subject to single-event- upsets (SEUs). The traditional mitigation method of applying triple modular redundancy (TMR) to the entire design does not have to be used in this application. This is because the majority of the SEUs impact the overall performance (measured by bit error rate) in the same way additive noise does. The results of this paper show which sections must be protected from SEUs and provide a guide for the bit error rate performance versus FPGA area tradeoff as a function of SEU mitigation.
  • Keywords
    Additive noise; Bit error rate; Circuits; Field programmable gate arrays; Hardware; Peer to peer computing; Protection; Redundancy; Single event transient; Single event upset;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Communications (ICC), 2010 IEEE International Conference on
  • Conference_Location
    Cape Town, South Africa
  • ISSN
    1550-3607
  • Print_ISBN
    978-1-4244-6402-9
  • Type

    conf

  • DOI
    10.1109/ICC.2010.5502571
  • Filename
    5502571