Title : 
An Efficient Method for Computation of Signatures
         
        
            Author : 
See, Chin-Foo ; Saluja, Kewal K.
         
        
            Author_Institution : 
Asia Peripheral Division, Hewlett Packard Singapore (Pte) Ltd.
         
        
        
        
        
        
            Keywords : 
Asia; Circuit faults; Circuit simulation; Circuit testing; Compaction; Computer errors; Cyclic redundancy check; Digital circuits; Linear feedback shift registers; Polynomials;
         
        
        
        
            Conference_Titel : 
VLSI Design, 1992. Proceedings., The Fifth International Conference on
         
        
        
            Print_ISBN : 
0-8186-2465-5
         
        
        
            DOI : 
10.1109/ICVD.1992.658055