Title :
Flip chip pin grid array (FC-PGA) packaging technology
Author :
Yeoh, Hwai Peng ; Lii, Mirng-Ji ; Sankman, Bob ; Azimi, Hamid
Author_Institution :
Intel Technol. Sdn Bhd, Penang, Malaysia
Abstract :
As microelectronics moves toward greater levels of integration, functionality and performance, packaging technology complexity grows in direct proportion. With Si process evolution to finer feature sizes, microprocessor designs are achieving higher system clock speeds. As a result, the level of integration and interconnect density between processor chips and substrate has increased tremendously. This brings an array of challenges for package design, substrate technology and assembly process development. For highly integrated packaging at competitive cost, the flip chip pin grid array package (FC-PGA) is proposed as an innovative socketable solution which includes use of laser drilled blind/buried vias on PTH and SMT pins to ease routing and alleviate loop inductance. Use of an existing PGA socket infrastructure expedites OEM acceptance of the new package design in various configurations. This paper describes key features of FC-PGA and technical challenges encountered in FC-PGA design/validation and packaging process development, such as solder composition selection, SMT pin technology optimization, and resolution of via delamination and flip chip solder bump nonwetting problems. FC-PGA package design and process development efforts have demonstrated the feasibility of high density flip chip interconnect on organic substrates and high speed bus functionality with low cost, high yield, manufacturable and reliable packaging solutions, which have been utilized in PentiumTM III microprocessors
Keywords :
assembling; circuit complexity; circuit optimisation; delamination; flip-chip devices; inductance; integrated circuit design; integrated circuit interconnections; integrated circuit packaging; microprocessor chips; network routing; soldering; surface mount technology; wetting; FC-PGA; FC-PGA design; FC-PGA design validation; FC-PGA package design; FC-PGA packaging technology; OEM acceptance; PGA socket infrastructure; PTH; Pentium III microprocessors; SMT pin technology optimization; SMT pins; Si process evolution; assembly process development; fine feature sizes; flip chip pin grid array package; flip chip pin grid array packaging technology; flip chip solder bump nonwetting; high density flip chip interconnect; high speed bus functionality; integration level; interconnect density; laser drilled blind vias; laser drilled buried vias; loop inductance; manufacturable packaging; microelectronics functionality; microelectronics integration; microelectronics performance; microprocessor design; organic substrates; package configurations; package design; packaging cost; packaging process development; packaging technology complexity; packaging yield; process development; processor chips; reliable packaging; routing; socketable solution; solder composition selection; substrate technology; system clock speeds; via delamination; Assembly; Clocks; Costs; Electronics packaging; Flip chip; Microelectronics; Microprocessors; Optical arrays; Pins; Surface-mount technology;
Conference_Titel :
Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd
Print_ISBN :
0-7803-6644-1
DOI :
10.1109/EPTC.2000.906346