Title : 
Time-frequency based pattern recognition technique for detection and classification of power quality disturbances
         
        
            Author : 
Chilukuri, M.V. ; Dash, P.K. ; Basu, K.P.
         
        
            Author_Institution : 
Multimedia Univ., Cyberjaya, Malaysia
         
        
        
        
        
        
            Abstract : 
This paper proposes a simple time-frequency based pattern recognition technique for detection, classification and quantification of power quality disturbance waveforms. The proposed technique consists of time-frequency analysis, feature extraction, and pattern classification. Though there are several time-frequency analysis techniques exists in the literature, this paper uses S-transform to obtain the time-frequency characteristics of power quality events because of its superior performance under noise as well as harmonics. Using the time-frequency characteristics, a set of optimal features are extracted for pattern classification of power quality disturbances. Finally, a simple rule based system is developed for detection and classification of various power quality disturbances. Although the authors have proposed recently an S-transform based fuzzy expert system for power quality detection and classification, the proposed technique is simple and 98% accurate even under the presence of harmonics and high signal to noise ratio for the most of power quality disturbances.
         
        
            Keywords : 
expert systems; feature extraction; fuzzy systems; power engineering computing; power supply quality; power system faults; power system harmonics; time-frequency analysis; transforms; S-transform; feature extraction; fuzzy expert system; pattern classification; power quality detection; power quality disturbance; time-frequency analysis; time-frequency based pattern recognition technique; Feature extraction; Knowledge based systems; Pattern classification; Pattern recognition; Power quality; Power system harmonics; Power system reliability; Time frequency analysis; Voltage fluctuations; Wavelet analysis;
         
        
        
        
            Conference_Titel : 
TENCON 2004. 2004 IEEE Region 10 Conference
         
        
            Print_ISBN : 
0-7803-8560-8
         
        
        
            DOI : 
10.1109/TENCON.2004.1414756