DocumentCode :
2913001
Title :
Evolutionary learning by a sensitivity-accuracy approach for multi-class problems
Author :
Martínez-Estudillo, F.J. ; Gutiérrez, P.A. ; Hervás, C. ; Fernández, J.C.
Author_Institution :
Dept. of Manage. & Quantitative Methods, ETEA, Cordoba
fYear :
2008
fDate :
1-6 June 2008
Firstpage :
1581
Lastpage :
1588
Abstract :
Performance evaluation is decisive when improving classifiers. Accuracy alone is insufficient because it cannot capture the myriad of contributing factors differentiating the performances of two different classifiers and approaches based on a multi-objective perspective are hindered by the growing of the Pareto optimal front as the number of classes increases. This paper proposes a new approach to deal with multi-class problems based on the accuracy (C) and minimum sensitivity (S) given by the lowest percentage of examples correctly predicted to belong to each class. From this perspective, we compare different fitness functions (accuracy, C , entropy, E , sensitivity, S , and area, A ) in an evolutionary scheme. We also present a two stage evolutionary algorithm with two sequential fitness functions, the entropy for the first step and the area for the second step. This methodology is applied to solve six benchmark classification problems. The two-stage approach obtains promising results and achieves a high classification rate level in the global dataset with an acceptable level of accuracy for each class.
Keywords :
Pareto optimisation; evolutionary computation; learning (artificial intelligence); pattern classification; Pareto optimal front; evolutionary learning; evolutionary scheme; minimum sensitivity; multiclass problems; sequential fitness functions; two stage evolutionary algorithm; Algorithm design and analysis; Entropy; Evolutionary computation; Multi-layer neural network; Multidimensional systems; Multilayer perceptrons; Neural networks; Neurons; Performance analysis; Visualization;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Evolutionary Computation, 2008. CEC 2008. (IEEE World Congress on Computational Intelligence). IEEE Congress on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-1822-0
Electronic_ISBN :
978-1-4244-1823-7
Type :
conf
DOI :
10.1109/CEC.2008.4631003
Filename :
4631003
Link To Document :
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