DocumentCode :
2913012
Title :
Promising Complex ASIC Design Verification Methodology
Author :
Assaf, Mansour H. ; Das, Sunil R. ; Hernias, W. ; Jone, Wen B.
Author_Institution :
Univ. of Trinidad & Tobago, O´´Meara
fYear :
2007
fDate :
1-3 May 2007
Firstpage :
1
Lastpage :
6
Abstract :
This paper aims at developing a design verification environment for complex application-specific integrated circuits (ASICs), with particular emphasis on embedded systems incorporating intellectual property (IP) cores. There exist methods to ensure correct design for IP core-based systems, but a promising approach to realize this is through the use of coverage-driven functional verification (CDV) and reuse methodology (RM). The CDV approach is based on the ASIC functionalities, and the verification process is accomplished in the early stages of the design. The use of functional coverage minimizes the number of test cases and thus enhances the verification process. The deterministic testing together with CDV and RM is applied to verify designs in the paper. The Specman e-language is used as a verification tool in the process since it incorporates the capabilities of both CDV and RM.
Keywords :
application specific integrated circuits; integrated circuit design; complex ASIC design verification methodology; complex application-specific integrated circuits; coverage-driven functional verification; intellectual property cores; reuse methodology; Application specific integrated circuits; Circuit testing; Costs; Design engineering; Design methodology; Embedded computing; Hardware design languages; Integrated circuit testing; Intellectual property; Time to market; Complex application-specific integrated circuits (ASICs); Verilog; coverage-driven functional verification (CDV) and reuse methodology (RM); design under test (DUT); deterministic testing; intellectual property (IP) cores; random input generator;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location :
Warsaw
ISSN :
1091-5281
Print_ISBN :
1-4244-0588-2
Type :
conf
DOI :
10.1109/IMTC.2007.379056
Filename :
4258344
Link To Document :
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