Title : 
Photoelectron emission from a polymer surface irradiated by oxygen ions
         
        
            Author : 
Yumoto, M. ; Okamura, S. ; Nitta, K.
         
        
            Author_Institution : 
Tokyo City Univ., Tokyo, Japan
         
        
        
            fDate : 
Aug. 30 2010-Sept. 3 2010
         
        
        
        
            Abstract : 
A satellite is required to have a long life and high reliability. However, a lot of atomic oxygen (AO), an erosive agent, is present at an altitude of several 100 km. Accordingly, it is necessary to monitor the degradation degree of the materials used on the satellite surface. In this study, to characterize the surface properties, photoelectron emission characteristics of several polymers were measured using a deuterium lamp and the band path filters. In addition, PE (Polyethylene) irradiated by oxygen ions was measured. From the measurement, the threshold energy for electron emission and its quantum efficiency were evaluated. As a result, the threshold energy of polymers was about 6 eV. The magnitude of PE irradiated by oxygen ions was not remarkably changed, but irradiation did increase its quantum efficiency. To clarify the mechanism of the phenomenon, an XPS (X-ray Photoelectron Spectroscope) and an AFM (Atomic Force Microscope) were used to analyze chemical bonds at the surface introduced by ion irradiation and surface roughness. The result shows that chemical bonds including oxygen atoms play an important role.
         
        
            Keywords : 
X-ray photoelectron spectra; atomic force microscopy; bonds (chemical); ion beam effects; ion-surface impact; polymers; surface roughness; AFM; X-ray photoelectron spectroscope; XPS; atomic force microscope; atomic oxygen; band path filters; chemical bonds; degradation degree; deuterium lamp; erosive agent; oxygen ion irradiation; photoelectron emission characteristics; polyethylene; polymer surface; quantum efficiency; satellite surface; surface properties; surface roughness; threshold energy; Chemicals; Current measurement; Ions; Polymers; Radiation effects; Rough surfaces; Surface roughness;
         
        
        
        
            Conference_Titel : 
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2010 24th International Symposium on
         
        
            Conference_Location : 
Braunschweig
         
        
        
            Print_ISBN : 
978-1-4244-8367-9
         
        
            Electronic_ISBN : 
1093-2941
         
        
        
            DOI : 
10.1109/DEIV.2010.5625784