Title :
Environmental Stress Screening for electronic equipment by random vibration: a critical approach to reliability estimation and planning
Author :
Catelani, Marcantonio ; Scarano, Valeria ; Trotta, Jacopo
Author_Institution :
Univ. di Firenze, Firenze
Abstract :
Individuated a deficiency of manufacturing practice and standards in environmental stress screening, ESS, we proposed a process of screening with random vibrations in which the time of test is optimized according to the components and the layout board, trying also to minimize the cost of the same test. The screening test is implemented and the results are discussed in this paper.
Keywords :
dynamic testing; electronic equipment testing; environmental stress screening; reliability; electronic equipment; environmental stress screening; layout board; manufacturing practice; random vibration; reliability estimation; reliability planning; Assembly; Circuit faults; Electronic equipment; Electronic equipment testing; Electronic switching systems; Frequency; Manufacturing processes; Physics; Stress; Vibration measurement; environmental stress screening; random vibration; reliability test;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location :
Warsaw
Print_ISBN :
1-4244-0588-2
DOI :
10.1109/IMTC.2007.379085
