DocumentCode :
2913313
Title :
Improved Method for Measurement of the Dielectric Properties of Microwave Substrates Using Microstrip T-resonator
Author :
Markovic, Dusan ; Jokanovic, Branka ; Marjanovic, Milka ; Djordjevic, Miroslav
Author_Institution :
Inst. IMTEL, Beograd
fYear :
2007
fDate :
1-3 May 2007
Firstpage :
1
Lastpage :
3
Abstract :
The paper presents an improved method for broadband characterization of dielectric materials at microwave frequencies. The results are calculated using closed form expressions and by HFSS. The proposed method provides more precise calculation of conductor losses by taking into account surface roughness. Compared with previously proposed methods, the new approach models loss tangent with more accuracy (both using closed-form expressions and EM simulator).
Keywords :
dielectric properties; microstrip resonators; microwave materials; printed circuits; surface roughness; EM simulator; HFSS; broadband characterization; closed form expressions; conductor losses; dielectric properties; microstrip T-resonator; microwave substrates; models loss tangent; surface roughness; Conducting materials; Dielectric materials; Dielectric measurements; Dielectric substrates; Microstrip; Microwave frequencies; Microwave measurements; Microwave theory and techniques; Rough surfaces; Surface roughness; EM-simulations; T-resonator; dielectric constant; loss tangent;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location :
Warsaw
ISSN :
1091-5281
Print_ISBN :
1-4244-0588-2
Type :
conf
DOI :
10.1109/IMTC.2007.379138
Filename :
4258362
Link To Document :
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