Improved Method for Measurement of the Dielectric Properties of Microwave Substrates Using Microstrip T-resonator

Author

Markovic, Dusan ; Jokanovic, Branka ; Marjanovic, Milka ; Djordjevic, Miroslav

Author_Institution

Inst. IMTEL, Beograd

fYear

2007

fDate

1-3 May 2007

Firstpage

1

Lastpage

3

Abstract

The paper presents an improved method for broadband characterization of dielectric materials at microwave frequencies. The results are calculated using closed form expressions and by HFSS. The proposed method provides more precise calculation of conductor losses by taking into account surface roughness. Compared with previously proposed methods, the new approach models loss tangent with more accuracy (both using closed-form expressions and EM simulator).

Keywords

dielectric properties; microstrip resonators; microwave materials; printed circuits; surface roughness; EM simulator; HFSS; broadband characterization; closed form expressions; conductor losses; dielectric properties; microstrip T-resonator; microwave substrates; models loss tangent; surface roughness; Conducting materials; Dielectric materials; Dielectric measurements; Dielectric substrates; Microstrip; Microwave frequencies; Microwave measurements; Microwave theory and techniques; Rough surfaces; Surface roughness; EM-simulations; T-resonator; dielectric constant; loss tangent;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE

Conference_Location

Warsaw

ISSN

1091-5281

Print_ISBN

1-4244-0588-2

Type

conf

DOI

10.1109/IMTC.2007.379138

Filename

4258362