Title :
Design and development challenges for micro chip carrier
Author :
Park, Hyung J. ; Kang, Kun-A ; Rho, K.S. ; Om, S.H. ; Oh, C.M. ; Yoon, S.E. ; Lee, O. ; Park, H.W. ; Lee, J.H.
Author_Institution :
Adv. Technol. Res. & Dev. Center, ASE Korea Inc., Kyunggi-Do, South Korea
Abstract :
The development of size and cost-effective leadframe based packages to replace conventional packages such as TSSOP or TQFP with the same or better package integrity and electrical performance is critical for penetration of future wireless subscriber applications. In this report, the development of a 0.9 mm thick MO-208 thin fine pitch plastic quad flat no lead package (5×5 mm, 28 leads, 0.5 mm pitch) with moisture sensitivity level (MSL) 1 reliability is discussed. Technical challenges for the development of package MO-208, called micro chip carrier in ASE Korea, are to control the mechanical impact on leads after mold array packaging (MAP) and to reduce the die stress with leadframe design based on various simulation processes. No mechanical impact on the leads after molding has been found to be a critical factor for control of the package integrity and to increase the lifetime of saw blades. It was also discovered that the package under development is able to achieve JEDEC MSL 1 reliability criteria. This paper discusses the package and process development performed in order to meet these new wireless subscriber application requirements. Benchmark and internal evaluation supported our approaches and our micro chip carrier (MCC) technology is very competitive
Keywords :
circuit simulation; encapsulation; fine-pitch technology; impact (mechanical); integrated circuit packaging; integrated circuit reliability; moisture; moulding; plastic packaging; sensitivity; 0.5 mm; 0.9 mm; 5 mm; JEDEC MSL 1 reliability criteria; MO-208 thin fine pitch plastic quad flat no lead package; MSL 1 reliability; TQFP; TSSOP; cost-effective leadframe based packages; die stress; electrical performance; leadframe design; mechanical impact; micro chip carrier; micro chip carrier technology; moisture sensitivity level 1 reliability; mold array packaging; molding; package MO-208; package design; package development; package integrity; process development; saw blade lifetime; simulation processes; size-effective leadframe based packages; wireless subscriber application; wireless subscriber applications; Copper; Electronics packaging; Microassembly; Moisture; Plastic integrated circuit packaging; Plastic packaging; Radio frequency; Semiconductor device packaging; Stress; Thermal resistance;
Conference_Titel :
Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd
Print_ISBN :
0-7803-6644-1
DOI :
10.1109/EPTC.2000.906392