DocumentCode :
2913396
Title :
Investigation of spatial correlations of pre-breakdown emission sites and breakdowns of vacuum gaps under short-pulsed testing
Author :
Nefyodtsev, E.V. ; Onischenko, S.A. ; Batrakov, A.V. ; Proskurovsky, D.I.
Author_Institution :
Inst. of High-Current Electron., SB RAS, Tomsk, Russia
fYear :
2010
fDate :
Aug. 30 2010-Sept. 3 2010
Firstpage :
60
Lastpage :
63
Abstract :
Emission activity of the stainless steel surface under 200-kV, 100-ns dc voltage pulses was studied with the use of the 4-channel, 12-bit ICCD camera. The gap was formed by a bulk cathode and a thin-foil anode. Both the cathode and anode surfaces were cleaned and polished preliminary by means of electron-beam treatment in the mode of short-time melting in vacuum. Observations gave a ground to tell about pre-breakdown emission sites of two kinds that are stable emission sites (SES´s) and unstable ones (UES´s), which are different in behaviour and in ability to initiate breakdowns. SES´s occurred on the cathode surface lead to breakdowns coinciding with SES´s in location. Breakdown strength as high as 1 MV/cm and even higher is achieved only under condition of absence any SEC. Close to 1 MV/cm, UES´s start to be recognized in images. An UES pattern is changed from shot to shot without breakdowns. As a rule, breakdowns occur in locations different from UES´s, recorded in the previous frame just before the breakdown. The results obtained could be of interest in study of pre-breakdown phenomena at extremely high electric fields in vacuum.
Keywords :
anodes; cathodes; vacuum circuit breakers; bulk cathode; electron-beam treatment; prebreakdown emission sites; short-pulsed testing; thin-foil anode; time 100 ns; vacuum gaps; voltage 200 kV; Anodes; Cathodes; Electric fields; Surface treatment; Vacuum breakdown;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2010 24th International Symposium on
Conference_Location :
Braunschweig
ISSN :
1093-2941
Print_ISBN :
978-1-4244-8367-9
Electronic_ISBN :
1093-2941
Type :
conf
DOI :
10.1109/DEIV.2010.5625801
Filename :
5625801
Link To Document :
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