Title :
MISSED: An environment for mixed-signal microsystem testing and diagnosis
Author :
Kerkhoff, H.G. ; Docherty, G.
Author_Institution :
MESA Res. Inst., Twente Univ., Netherlands
Abstract :
A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging
Keywords :
automatic test software; design for testability; diagnostic expert systems; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; DFT libraries; MISSED; expert system; fault libraries; generic routines; hierarchical backtrace; implementation data; mixed-signal chip debugging; mixed-signal microsystem testing; prototype verification; test-pattern generation; testability; testability-analysis; Automatic testing; Circuit faults; Circuit testing; Design engineering; Expert systems; Hardware; Libraries; Prototypes; System testing; Time to market;
Conference_Titel :
Test Symposium, 1993., Proceedings of the Second Asian
Conference_Location :
Beijing
Print_ISBN :
0-8186-3930-X
DOI :
10.1109/ATS.1993.398785
