MISSED: An environment for mixed-signal microsystem testing and diagnosis

Author

Kerkhoff, H.G. ; Docherty, G.

Author_Institution

MESA Res. Inst., Twente Univ., Netherlands

fYear

1993

fDate

16-18 Nov 1993

Firstpage

88

Lastpage

93

Abstract

A tight link between design and test data is proposed for speeding up test-pattern generation and diagnosis during mixed-signal prototype verification. Test requirements are already incorporated at the behavioral level and specified with increased detail at lower hierarchical levels. A strict distinction between generic routines and implementation data makes reuse of software possible. A testability-analysis tool and test and DFT libraries support the designer to guarantee testability. Hierarchical backtrace procedures in combination with an expert system and fault libraries assist the designer during mixed-signal chip debugging

Keywords

automatic test software; design for testability; diagnostic expert systems; fault diagnosis; integrated circuit testing; mixed analogue-digital integrated circuits; DFT libraries; MISSED; expert system; fault libraries; generic routines; hierarchical backtrace; implementation data; mixed-signal chip debugging; mixed-signal microsystem testing; prototype verification; test-pattern generation; testability; testability-analysis; Automatic testing; Circuit faults; Circuit testing; Design engineering; Expert systems; Hardware; Libraries; Prototypes; System testing; Time to market;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1993., Proceedings of the Second Asian

Conference_Location

Beijing

Print_ISBN

0-8186-3930-X

Type

conf

DOI

10.1109/ATS.1993.398785

Filename

398785