DocumentCode :
2913419
Title :
Laser drilling of micro-vias in PCB substrates
Author :
Gan, Eric K W ; Zheng, H.Y. ; Lim, G.C.
Author_Institution :
Gintic Inst. of Manuf. Technol., Singapore
fYear :
2000
fDate :
2000
Firstpage :
321
Lastpage :
326
Abstract :
Traditional mechanical drilling of PCB vias is practical only for through holes with diameters >200 μm. With the emerging global demand for higher packaging densities, extensive R&D to produce micro-vias as small as 50 μm is being carried out worldwide. Laser drilling of micro-vias is accepted as a feasible method and has even seen limited use in production. It offers greater resolution over the mechanical technique with its ability to produce via sizes well below 50 μm. The smallest via size that can be drilled with lasers is very dependent on the laser wavelength, beam energy density, and substrate material composition and thickness. As most PCB materials have finite absorption characteristics with respect to the laser wavelength, only certain laser classes are compatible with commonly-used substrate materials. This paper describes the process of fabricating microvias reliably in BT, FR4, polyimide and alumina substrates using the RF and TEA CO2, 3rd-harmonic Nd:YAG, and KrF excimer lasers, respectively. Both blind and through-vias were drilled and evaluated for taper, wall-angle and smoothness by optical microscopy, SEM and cross-sectional analyses. The beam/material interaction mechanisms for the various lasers and PCB substrates were examined. The effects of substrate composition such as fiber density distribution and copper cladding were also studied, as well as the via hole platability in terms of via dimensions and features. Process parameters were then further optimized to determine the required laser pulse energy, peak power, number of pulses and energy density
Keywords :
circuit reliability; laser beam machining; light absorption; optical microscopy; packaging; printed circuit manufacture; printed circuit testing; scanning electron microscopy; 200 micron; 50 micron; Al2O3; BT substrates; CO2; Cu; FR4 substrates; KrF; KrF excimer lasers; PCB materials; PCB substrates; PCB vias; RF CO2 laser; SEM; TEA CO2 laser; YAG:Nd; YAl5O12:Nd; alumina substrates; beam/material interaction mechanisms; blind vias; copper cladding; cross-sectional analyses; energy density; feature resolution; fiber density distribution; finite absorption characteristics; laser beam energy density; laser class compatibility; laser drilling; laser pulse energy; laser pulses; laser wavelength; mechanical drilling; micro-via size; micro-vias; optical microscopy; packaging density; peak power; polyimide substrates; process parameter optimization; reliable microvia fabrication; substrate composition; substrate material composition; substrate material thickness; substrate materials; third-harmonic Nd:YAG laser; through hole diameter; through-vias; via dimensions; via features; via hole platability; via size; via smoothness; via taper; via wall-angle; Drilling; Energy resolution; Fiber lasers; Laser beams; Optical materials; Optical microscopy; Optical pulses; Packaging; Production; Scanning electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd
Print_ISBN :
0-7803-6644-1
Type :
conf
DOI :
10.1109/EPTC.2000.906394
Filename :
906394
Link To Document :
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