DocumentCode :
2913469
Title :
An experimental procedure to derive reliable IBIS models
Author :
Zak, Thierry ; Ducrot, Marc ; Xavier, Christian ; Drissi, Mhamed
Author_Institution :
Thomson-CSF Detexis, Brest, France
fYear :
2000
fDate :
2000
Firstpage :
339
Lastpage :
344
Abstract :
One of the greater parts of PCB research and development is to manage the electromagnetic compatibility and signal integrity (EMC/SI) constraints. However, the performances of these EMC/SI tools are based on the quality of used library models: PCB interconnections and IBIS models (I/O buffer information specification). To obtain an IBIS model, three methods are possible: the component maker using the Web, SPICE conversion if the corresponding SPICE model is available, and measurements. This paper describes an experimental procedure that allows creation of reliable IBIS model version 2.1 from measurements. This procedure allows building of models using classical measurement devices, controlling all steps of the procedure and achieving the required model accuracy with regard to its application field. To check the accuracy of the developed procedure, the paper presents the characterization of a TQFP component. Through a classical SI phenomenon (reflection), comparison between measured and simulated results is performed, using the available IBIS Web model and the measured IBIS model
Keywords :
SPICE; buffer circuits; electromagnetic compatibility; electromagnetic interference; integrated circuit interconnections; integrated circuit measurement; integrated circuit modelling; integrated circuit packaging; printed circuit design; printed circuit testing; EMC/SI tools; I/O buffer information specification models; IBIS Web model; IBIS models; PCB development; PCB interconnection models; PCB measurements; PCB research; SPICE conversion; SPICE model; TQFP component characterization; classical measurement devices; component maker; electromagnetic compatibility; library model quality; measured IBIS model; model accuracy; reliable IBIS models; signal integrity; Bidirectional control; Circuit simulation; Clamps; Diodes; Electromagnetic compatibility; Integrated circuit measurements; Packaging; Power measurement; Power supplies; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Packaging Technology Conference, 2000. (EPTC 2000). Proceedings of 3rd
Print_ISBN :
0-7803-6644-1
Type :
conf
DOI :
10.1109/EPTC.2000.906397
Filename :
906397
Link To Document :
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