DocumentCode
2914090
Title
Dielectric strength of vacuum interrupters influence of manufacturing process
Author
Schellekens, Hans ; Chombart, François ; Mottin, Romain ; Vianna, Fabio
Author_Institution
BU-Energy, Schneider-Electr., Grenoble, France
fYear
2010
fDate
Aug. 30 2010-Sept. 3 2010
Firstpage
36
Lastpage
39
Abstract
A test method based on combined measurement of voltage breakdown value and position is used to measure the microscopic electric field enhancement factor on copper and stainless steel electrodes in vacuum. This method is then used to evaluate the effectiveness of an industrial cleaning process. Process parameters are identified that positively influence the dielectric strength. An improvement of 15% is obtained.
Keywords
cleaning; electric breakdown; electric strength; metallurgical industries; stainless steel; vacuum interrupters; dielectric strength; industrial cleaning process; manufacturing process; microscopic electric field enhancement factor; vacuum interrupters; voltage breakdown value measurement; Cleaning; Microscopy; Needles; Steel; Vacuum breakdown; circuit-breaker; manufacturing; vacuum breakdown; vacuum interrupter;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2010 24th International Symposium on
Conference_Location
Braunschweig
ISSN
1093-2941
Print_ISBN
978-1-4244-8367-9
Electronic_ISBN
1093-2941
Type
conf
DOI
10.1109/DEIV.2010.5625836
Filename
5625836
Link To Document