DocumentCode :
2914354
Title :
Atomic data from plasma based measurements and compilations of transition probabilities
Author :
Griesmann, U. ; Bridges, J.M. ; Roberts, J.R. ; Wiese, W.L. ; Fuhr, J.R.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear :
1996
fDate :
3-5 June 1996
Firstpage :
123
Abstract :
Summary from only given. High efficiency electrical light sources used in lighting applications are based on electrical discharges in plasmas. The systematic search for improved lighting plasmas increasingly relies on plasma discharge modeling with computers and requires better and more comprehensive knowledge of basic atomic data such as radiative transition probabilities and collision cross sections. NIST has ongoing research programs aimed at the study of thermal equilibrium plasmas such as high pressure electric arcs and non-equilibrium plasmas in radio-frequency discharges and high current hollow cathode lamps. In emission experiments we have measured branching fractions and determined absolute transition probabilities for spectral lines in Ne I, Ne II, F I, O I and O II. In case of the Ne measurements the line radiation emitted by a high current hollow cathode lamp was analyzed with a 2 m monochromator. In addition, the spectra of Ne I and Ne II were measured with a UV Fourier transform spectrometer at very high spectral resolution. The line intensities were subsequently calibrated to absolute radiances. Where complete sets of transitions from an upper level could be observed, recent lifetime data for these levels were used to determine absolute transition probabilities. The accuracy of our branching fraction data is 5% for the stronger lines.
Keywords :
neon; F; F I; Ne; Ne I; Ne II; O; O I; O II; UV Fourier transform spectrometer; atomic data; branching fraction data; branching fractions; collision cross sections; computers; electrical discharges; high current hollow cathode lamps; high efficiency electrical light sources; high pressure electric arcs; lighting applications; line intensities; line radiation; monochromator; nonequilibrium plasmas; plasma based measurements; plasma discharge modeling; radio-frequency discharges; thermal equilibrium plasmas; transition probabilities; Application software; Atomic measurements; Cathodes; Current measurement; Fault location; Lamps; Light sources; Plasma applications; Plasma measurements; Plasma sources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location :
Boston, MA, USA
ISSN :
0730-9244
Print_ISBN :
0-7803-3322-5
Type :
conf
DOI :
10.1109/PLASMA.1996.550273
Filename :
550273
Link To Document :
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