• DocumentCode
    2914364
  • Title

    Microwave Dielectric Properties Measurements Using the Waveguide Reflection Dielectric Resonator

  • Author

    Sheen, Jyh

  • Author_Institution
    Nat. Formosa Univ., Huwei
  • fYear
    2007
  • fDate
    1-3 May 2007
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Measurements of dielectric properties of the homogeneous and isotropic medium in the microwave frequencies by a waveguide reflection dielectric resonator are studied. A dielectric rod sample is put inside of a rectangular cavity made by a microwave waveguide. The sample´s dielectric constant and loss tangent are measured at the resonant frequency of the TE01delta mode. A simple field model of the waveguide reflection resonator is developed for the measurements of dielectric properties. This field model is developed from that of the parallel-plate dielectric resonator. Reflection signal is measured for the calculations of dielectric properties. The dielectric properties are computed from the resonant frequency, structure dimensions, and unloaded quality factor. The effect of the conductor loss of the metal cavity is studied. The measurement accuracy of dielectric properties is discussed by comparing the results with those measured by other well known techniques.
  • Keywords
    dielectric resonators; permittivity; conductor loss; dielectric constant-loss tangent; dielectric properties; dielectric rod sample; metal cavity; microwave dielectric properties measurements; microwave waveguide; quality factor; rectangular cavity; resonant frequency; waveguide reflection dielectric resonator; Dielectric constant; Dielectric loss measurement; Dielectric measurements; Frequency measurement; Loss measurement; Microwave frequencies; Microwave measurements; Rectangular waveguides; Reflection; Resonant frequency; complex permittivity; dielectric constant; dielectric loss; dielectric resonator; loss tangent; reflection signal;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
  • Conference_Location
    Warsaw
  • ISSN
    1091-5281
  • Print_ISBN
    1-4244-0588-2
  • Type

    conf

  • DOI
    10.1109/IMTC.2007.379350
  • Filename
    4258433