DocumentCode :
2914396
Title :
Simultaneous dimensionality reduction and human age estimation via kernel partial least squares regression
Author :
Guo, Guodong ; Mu, Guowang
Author_Institution :
Lane Dept. of CSEE, West Virginia Univ., Morgantown, WV, USA
fYear :
2011
fDate :
20-25 June 2011
Firstpage :
657
Lastpage :
664
Abstract :
Human age estimation has recently become an active research topic in computer vision and pattern recognition, because of many potential applications in reality. In this paper we propose to use the kernel partial least squares (KPLS) regression for age estimation. The KPLS (or linear PLS) method has several advantages over previous approaches: (1) the KPLS can reduce feature dimensionality and learn the aging function simultaneously in a single learning framework, instead of performing each task separately using different techniques; (2) the KPLS can find a small number of latent variables, e.g., 20, to project thousands of features into a very low-dimensional subspace, which may have great impact on real-time applications; and (3) the KPLS regression has an output vector that can contain multiple labels, so that several related problems, e.g., age estimation, gender classification, and ethnicity estimation can be solved altogether. This is the first time that the kernel PLS method is introduced and applied to solve a regression problem in computer vision with high accuracy. Experimental results on a very large database show that the KPLS is significantly better than the popular SVM method, and outperform the state-of-the-art approaches in human age estimation.
Keywords :
computer vision; feature extraction; least squares approximations; regression analysis; computer vision; human age estimation; kernel partial least square regression; linear PLS method; pattern recognition; simultaneous feature dimensionality reduction; Aging; Databases; Estimation; Feature extraction; Kernel; Manifolds; Support vector machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Vision and Pattern Recognition (CVPR), 2011 IEEE Conference on
Conference_Location :
Providence, RI
ISSN :
1063-6919
Print_ISBN :
978-1-4577-0394-2
Type :
conf
DOI :
10.1109/CVPR.2011.5995404
Filename :
5995404
Link To Document :
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