DocumentCode
2914482
Title
Pseudo-Exhaustive Built-in Self-Testing of Signal Integrity for High-Speed SoC Interconnects
Author
Liu, H. ; Jone, Wen B ; Das, S.R.
Author_Institution
Cincinnati Univ., Cincinnati
fYear
2007
fDate
1-3 May 2007
Firstpage
1
Lastpage
4
Abstract
As technology approaches deep sub-micron technology and clock frequency approaches Giga Hertz, the signal integrity problem of the high speed interconnect is becoming a more and more serious issue. In this paper, we propose a pseudo-exhaustive testing scheme for signal integrity faults of high speed SoC interconnects.
Keywords
integrated circuit interconnections; integrated circuit testing; system-on-chip; capacitive coupling; high speed interconnect; high-speed SoC interconnect; inductive coupling; pseudo-exhaustive built-in self-testing; signal integrity; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Crosstalk; Electrical fault detection; Fault detection; Integrated circuit interconnections; Signal generators; Test pattern generators; Pseudo-exhaustive testing; built-in self testing; capacitive coupling; inductive coupling; signal integrity testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location
Warsaw
ISSN
1091-5281
Print_ISBN
1-4244-0588-2
Type
conf
DOI
10.1109/IMTC.2007.379372
Filename
4258440
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