Title :
Atomic spectroscopic data for lighting applications
Author :
Nave, G. ; Sansonetti, C.J. ; Reader, J. ; Martin, W.C.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Summary form only given. NIST is currently establishing a new experimental program aimed at measuring atomic data needed for lighting applications. The centerpiece of this effort is the high resolution Fourier transform spectrometer recently installed at NIST. This instrument has a resolution of 0.0025 cm/sup -1/ with a wavelength range of 200 nm to 18 /spl mu/m, enabling us to measure almost all transitions of interest. Its linear intensity response gives a quantitative measure of the relative strengths of various radiative decay paths. The FTS is currently operable, but it will soon be improved with the addition of new data acquisition electronics and a vacuum enclosure. We will discuss prospective areas of research which will be planned on the basis of full and continuing consultation with lighting-company researchers, review the specifications of the FTS, display sample spectra that show its capabilities, and report on progress in the early stages of work on the spectrum of dysprosium.
Keywords :
Fourier transform spectra; Dy; atomic spectroscopic data; data acquisition electronics; high resolution Fourier transform spectrometer; lighting applications; lighting-company researchers; linear intensity response; quantitative measure; radiative decay paths; sample spectra; transitions; vacuum enclosure; Atomic measurements; Energy states; Fault location; Lamps; Light sources; NIST; Plasma measurements; Plasma sources; Spectroscopy; Wavelength measurement;
Conference_Titel :
Plasma Science, 1996. IEEE Conference Record - Abstracts., 1996 IEEE International Conference on
Conference_Location :
Boston, MA, USA
Print_ISBN :
0-7803-3322-5
DOI :
10.1109/PLASMA.1996.550274