DocumentCode :
2914705
Title :
Enhanced Time Base Jitter Compensation of Sine Waves
Author :
Verbeyst, Frans ; Rolain, Yves ; Pintelon, Rik ; Schoukens, Johan
Author_Institution :
Vrije Univ. Brussel, Brussels
fYear :
2007
fDate :
1-3 May 2007
Firstpage :
1
Lastpage :
5
Abstract :
The goal of this paper is to estimate the amplitude of a sine wave in the presence of time base jitter, time base drift, time base distortion and additive noise. This work is motivated by a comparative study of the amplitude distortion estimated using a nose-to-nose and electro-optic sampling based calibration of a high-frequency sampling oscilloscope. It uses the exact expression of the variance of a sine wave in the presence of normally distributed additive and jitter noise, instead of a Taylor approximation of this expression.
Keywords :
calibration; jitter; oscilloscopes; additive noise; amplitude distortion estimation; electrooptic sampling; enhanced time base jitter compensation; high frequency sampling oscilloscope; nose-to-nose sampling; sine waves; time base distortion; time base drift; Additive noise; Amplitude estimation; Calibration; Distortion measurement; Jitter; NIST; Noise measurement; Oscilloscopes; Phase distortion; Sampling methods; high-frequency sampling oscilloscopes; system identification; time base distortion; time base drift; time base jitter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2007. IMTC 2007. IEEE
Conference_Location :
Warsaw
ISSN :
1091-5281
Print_ISBN :
1-4244-0588-2
Type :
conf
DOI :
10.1109/IMTC.2007.379391
Filename :
4258453
Link To Document :
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