Title :
Fabrication of microprobe array with sub-100 nm nano-heater for nanometric thermal imaging and data storage
Author :
Dong-Ween Lee ; Ono, T. ; Abe, T. ; Esashi, M.
Author_Institution :
Fac. of Eng., Tohoku Univ., Sendai, Japan
Abstract :
A novel fabrication method of a micro-thermal probe and its array for nanometric thermal imaging and a technological approach for probe-based data storage are presented. A small metal wire for a nano-heater is fabricated at the apex of a pyramidal SiO/sub 2/ tip, which is formed by low temperature oxidation of a silicon etch-pit at 950/spl deg/C, consecutive metal deposition (Pt/Cr or Au/Cr) to fill the metal into the etch-pit, and etching of the SiO/sub 2/ in buffered HF solution. Another metal (Ni) is deposited on the small wire to form a metal-to-metal junction that enables to measure the temperature at the tip end. Metal feed-through are formed on a glass substrate that is bonded with the probe array, which enables to transmit a high-speed signal to a processing-circuit and increase the probe array density. Using the thermal probe, temperature distribution on a sample surface is measured. The heating capability of nano-heater is confirmed by the resistivity change and thermophoton emission from the nano-heater when flowing a small current into the nano-heater. By using a micro-probe, preliminary experiment for data writing and erasing is performed on phase change medium.
Keywords :
infrared imaging; microsensors; 100 nm; data storage; high-speed signal; metal-to-metal junction; microprobe array; nanometric thermal imaging; probe array density; sub-100 nm nano-heater; temperature distribution; thermal probe; Chromium; Etching; Fabrication; Gold; Memory; Oxidation; Probes; Silicon; Temperature measurement; Wire;
Conference_Titel :
Micro Electro Mechanical Systems, 2001. MEMS 2001. The 14th IEEE International Conference on
Conference_Location :
Interlaken, Switzerland
Print_ISBN :
0-7803-5998-4
DOI :
10.1109/MEMSYS.2001.906514