DocumentCode :
291482
Title :
Polarimetric backscattering from thin saline ice related to ice physical and morphological characteristics
Author :
Nghiem, S.V. ; Kwok, R. ; Yueh, S.H. ; Kong, J.A. ; Tassoudji, M.A. ; Hsu, C.C. ; Gow, A.J. ; Perovich, D.K.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume :
1
fYear :
1994
fDate :
8-12 Aug 1994
Firstpage :
541
Abstract :
A model for polarimetric backscattering from thin saline ice, including volume and surface scattering mechanisms, is used to relate ice physical and morphological characteristics to the backscattering signatures obtained under controlled laboratory conditions. The model is based on the analytic wave theory and accounts for ellipsoidal brine inclusions, c-axis orientations, rough interfaces, vertical anisotropy, and permittivity tensor determined with brine volume governed by thermodynamic phase equations during the process of ice growth. A brine or slush cover layer is modelled in a layered configuration as a lossy layer with large permittivity magnitude due to the high salinity. The contribution to backscattering from rough interfaces is included with consideration of wave attenuation and phase difference effect in the anisotropic ice media
Keywords :
backscatter; electromagnetic wave scattering; oceanographic techniques; radar applications; radar cross-sections; radar polarimetry; remote sensing; remote sensing by radar; sea ice; analytic wave theory; backscatter model; backscattering signature; c-axis orientation; ellipsoidal brine inclusion; ice physical conditions; layered configuration; measurement technique; morphological characteristics; permittivity tensor; phase difference effect wave attenuation; polarimetric backscattering; radar scattering; remote sensing; rough interface; sea ice; sea surface ocean radar polarimetry; slush cover anisotropic media; surface scattering mechanics; thin saline ice; vertical anisotropy; volume scattering; Anisotropic magnetoresistance; Backscatter; Ice surface; Laboratories; Permittivity; Rough surfaces; Scattering; Surface morphology; Surface roughness; Tensile stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Geoscience and Remote Sensing Symposium, 1994. IGARSS '94. Surface and Atmospheric Remote Sensing: Technologies, Data Analysis and Interpretation., International
Conference_Location :
Pasadena, CA
Print_ISBN :
0-7803-1497-2
Type :
conf
DOI :
10.1109/IGARSS.1994.399177
Filename :
399177
Link To Document :
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