DocumentCode :
2915036
Title :
Influence of nitrogen pressure on silicon content in Ti-Si-N coatings deposited by the vacuum-arc method
Author :
Aksenov, I.I. ; Belous, V.A. ; Zadneprovskiy, Yu.A. ; Kuprin, A.S. ; Lomino, N.S. ; Ovcharenko, V.D. ; Sobol, O.V.
Author_Institution :
“Kharkov Inst. of Phys. & Technol.”, Nat. Sci. Center, Kharkov, Ukraine
fYear :
2010
fDate :
Aug. 30 2010-Sept. 3 2010
Firstpage :
497
Lastpage :
500
Abstract :
Influence of nitrogen pressure on silicon content in Ti-Si-N coatings deposited by the vacuum-arc method using Ti0,96-Si0,04 alloy as a consumable cathode material was was investigated. It is found out, that the silicon content in coatings regardless of deposition conditions is lower than in the cathode. In pressure range from 5·10-4 to 10-3 Torr, film has minimal silicon content (~ 0.4 wt. %) and maximal hardness (35 GPa). It is supposed, that the extremum character of coating silicon concentration and hardness dependencies on nitrogen pressure is a result of distinction of structure-phase composition of the coatings obtained at different pressure.
Keywords :
cathodes; nitrogen; silicon alloys; titanium alloys; vacuum arcs; vacuum insulation; Ti-Si-N; cathode material; nitrogen pressure; silicon concentration coating; structure-phase composition; vacuum-arc method; Anodes; Cathodes; Coatings; Nitrogen; Plasmas; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2010 24th International Symposium on
Conference_Location :
Braunschweig
ISSN :
1093-2941
Print_ISBN :
978-1-4244-8367-9
Electronic_ISBN :
1093-2941
Type :
conf
DOI :
10.1109/DEIV.2010.5625887
Filename :
5625887
Link To Document :
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