Title :
Advantages using pulse shape discrimination to assign the depth of interaction information (DOI) from a multi-layer phoswich detector
Author :
Schmand, M. ; Eriksson, L. ; Casey, M.E. ; Wienhard, K. ; Flügge, G. ; Nutt, R.
Author_Institution :
CTI PET Syst. Inc., Knoxville, TN, USA
Abstract :
Recently new high resolution brain PET and PET/SPECT tomographs have been discussed using phoswich detectors. The detector design with two layers of scintillator crystals in the z-axis with different physical properties as light decay time or light yield makes it feasible to assign the depth of interaction (DOI) information in order to be able to correct for spatial degradation in PET or to operate the detector in PET or SPECT mode. In this work we discuss the possibility separating events from the two different layers in the time domain using pulse shape discrimination or in the energy domain using pulse height discrimination. Further we investigated the feasibility of inter detector scatter suppression using pulse shape discrimination. The measurements have been done using a LSO/LSO high resolution PET detector, a LSO and GSO crystal in coincidence and a NaI(Tl)/LSO combined PET/SPECT detector
Keywords :
gadolinium compounds; lutetium compounds; positron emission tomography; single photon emission computed tomography; sodium compounds; solid scintillation detectors; thallium; Gd2SiO5:Ce; LSO/LSO high resolution PET detector; Lu2SiO4:Ce; NaI(Tl)/LSO combined PET/SPECT detector; NaI:Tl; PET/SPECT tomographs; depth of interaction information; high resolution brain PET; inter detector scatter suppression; multi layer phoswich detector; pulse height discrimination; pulse shape discrimination; scintillator crystals; spatial degradation; Degradation; Event detection; Light scattering; Particle scattering; Photonic crystals; Positron emission tomography; Pulse shaping methods; Shape; Solid scintillation detectors; Spatial resolution;
Conference_Titel :
Nuclear Science Symposium, 1998. Conference Record. 1998 IEEE
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-5021-9
DOI :
10.1109/NSSMIC.1998.774354