Title :
The probability logics for nanoscale inverters cascade
Author :
Lu, Xiaojun ; Yang, Guowu ; Li, Jianping ; Song, Xiaoyu ; Hung, William N N
Author_Institution :
Sch. of Comput. Sci., Univ. of Electron. Sci. & Technol., Chengdu
Abstract :
Device failure is an important consideration in nano-scale design. This paper presents a probabilistic logic model to compute the probability distribution of the nano gate states. The characterization is based on Markov random field and statistical physics. The basic logic gates are probabilistically characterized. The effectiveness of the method is demonstrated by an inverter and the inverter cascade. Our analysis shows that the device probability distribution highly depends on the system structures and other performance parameters.
Keywords :
Markov processes; circuit reliability; logic gates; nanoelectronics; probabilistic logic; probability; statistical distributions; Markov random field; device failure; device probability distribution; nanoscale inverters cascade; probability distribution; probability logics; statistical physics; Distributed computing; Logic devices; Logic gates; Markov random fields; Nanoscale devices; Performance analysis; Physics; Probabilistic logic; Probability distribution; Pulse inverters;
Conference_Titel :
Evolutionary Computation, 2008. CEC 2008. (IEEE World Congress on Computational Intelligence). IEEE Congress on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-1822-0
Electronic_ISBN :
978-1-4244-1823-7
DOI :
10.1109/CEC.2008.4631131
