DocumentCode :
2915300
Title :
Extending external validity measures for determining the number of clusters
Author :
Zhao, Qinpei ; Xu, Mantao ; Fränti, Pasi
Author_Institution :
Sch. of Comput., Univ. of Eastern Finland, Joensuu, Finland
fYear :
2011
fDate :
22-24 Nov. 2011
Firstpage :
931
Lastpage :
936
Abstract :
External validity measures in cluster analysis evaluate how well the clustering results match to a prior knowledge about the data. However, it is always intractable to get the prior knowledge in the practical problem of unsupervised learning, such as cluster analysis. In this paper, we extend the external validity measures for both hard and soft partitions by a resampling method, where no prior information is needed. To lighten the time burden caused by the resampling method, we incorporate two approaches into the proposed method: (i) extending external validity measures for soft partitions in a computational time of O(M2N); (ii) an efficient sub-sampling method with time complexity of O(N). The proposed method is then applied and reviewed in determining the number of clusters for the problem of unsupervised learning, cluster analysis. Experimental results has demonstrated the proposed method is very effective in solving the number of clusters.
Keywords :
computational complexity; pattern clustering; sampling methods; statistical analysis; unsupervised learning; cluster analysis; computational time; external validity measure; resampling method; soft partition; subsampling method; time complexity; unsupervised learning; Clustering algorithms; Correlation; Educational institutions; Image segmentation; Indexes; Partitioning algorithms; Time measurement; clustering; external cluster validity; image segmentation; subsampling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Systems Design and Applications (ISDA), 2011 11th International Conference on
Conference_Location :
Cordoba
ISSN :
2164-7143
Print_ISBN :
978-1-4577-1676-8
Type :
conf
DOI :
10.1109/ISDA.2011.6121777
Filename :
6121777
Link To Document :
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