DocumentCode
29155
Title
Detection of Electromagnetic Radiations Sources at the Switching Time Scale Using an Inverse Problem-Based Resolution Method—Application to Power Electronic Circuits
Author
Beghou, Lotfi ; Costa, Francois ; Pichon, Lionel
Author_Institution
Lab. des Syst. et Applic. pour l´Inf. et l´energie, Cachan, France
Volume
57
Issue
1
fYear
2015
fDate
Feb. 2015
Firstpage
52
Lastpage
60
Abstract
This paper presents a detailed study about the characterization of electromagnetic near-fields emitted from power electronic circuits. The approach proposed here provides a radiation model, which verifies the uniqueness of the solution using an inverse problem-based resolution method. For this purpose, the characterization method has been combined with an experimental mapping realized at the switching time scale. This mapping is based on a Fourier analysis applied on the measurements acquired from the device under study. It allowed us to trace a prior radiations map over the device under study. This radiation map is then exploited in order to validate the uniqueness of the final result, a result that has been obtained by solving the inverse problem using a genetic algorithm (GA) to optimize the highly nonlinear fitness function. The precision and the accuracy of the method have been validated by the superposition of the obtained radiation models over the circuit topology. The correlation between the sources parameters (position, orientation, geometrical parameters and currents) and the parameters corresponding to the components located at the regions defined by the radiation map has been successfully performed. This allowed us to confirm that the physical reality is respected, and to assume that we have reached the uniqueness of the solution.
Keywords
Fourier analysis; electromagnetic wave propagation; genetic algorithms; inverse problems; power electronics; Fourier analysis; GA; characterization method; circuit topology; electromagnetic radiations source detection; experimental mapping; genetic algorithm; geometrical parameters; inverse problem-based resolution method; nonlinear fitness function; orientation parameters; physical reality; position parameters; power electronic circuits; radiation map; sources parameters; superposition; switching time scale; Choppers (circuits); MOSFET; Switches; Transient analysis; Vectors; Electromagnetic characterization; electromagnetic compatibility; genetic algorithms; stochastic optimization; switched mode power supplies (SMPS);
fLanguage
English
Journal_Title
Electromagnetic Compatibility, IEEE Transactions on
Publisher
ieee
ISSN
0018-9375
Type
jour
DOI
10.1109/TEMC.2014.2363675
Filename
6948366
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