DocumentCode :
2915519
Title :
New Measurement Technology of Structural Silicone Sealant in Hidden Frame Supported Glass Curtain Wall Based on FFT Power Spectrum
Author :
Yong-hong, Miao ; Yinjie ; Guo-jun, Cai ; Jian-zu, Gu
Author_Institution :
Jiangsu Univ., Zhenjiang, China
fYear :
2011
fDate :
19-20 Feb. 2011
Firstpage :
92
Lastpage :
95
Abstract :
The measurement based on FFT power spectrum of pulse transient dynamic response of structural silicone sealant damage in Hidden frame supported glass curtain wall was first proposed in the paper. The signal of four testing points was gathered and FFT Power Spectrum was used to analyze. Power spectral main peak frequency of the signal in contributing proportion of the total power (ηi) was taken as a dependent variable of the structural silicone sealant damage length (α). Experimental data were fitted to establish a functional relations between `α´ and `ηi´ by Gaussian function or Lorentzian function, and the small damage value of `α´ was used to be detected. Research results show that it will be helpful for the application of the structural silicone sealant damage detection technology in the hidden frame supported glass curtain wall.
Keywords :
condition monitoring; fast Fourier transforms; measurement; sealing materials; silicones; structural engineering; fast Fourier transform power spectrum; hidden frame supported glass curtain wall; measurement technology; power spectral main peak frequency; pulse transient dynamic response; structural silicone sealant damage; Density functional theory; Equations; Fitting; Frequency domain analysis; Glass; Sealing materials; Vibrations; Hidden Frame supported Glass Curtain wall; Power Spectrum; Structural silicone sealant; frequency response function;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Distributed Control and Intelligent Environmental Monitoring (CDCIEM), 2011 International Conference on
Conference_Location :
Changsha
Print_ISBN :
978-1-61284-278-3
Electronic_ISBN :
978-0-7695-4350-5
Type :
conf
DOI :
10.1109/CDCIEM.2011.496
Filename :
5747772
Link To Document :
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