DocumentCode :
2915633
Title :
Improving classification rates for use in fatigue countermeasure devices using brain activity
Author :
Tran, Yvonne ; Craig, Ashley ; Wijesuriya, Nirupama ; Nguyen, Hung
Author_Institution :
Key Univ. Res. Centre in Health Technol., Univ. of Technol., Sydney, Sydney, NSW, Australia
fYear :
2010
fDate :
Aug. 31 2010-Sept. 4 2010
Firstpage :
4460
Lastpage :
4463
Abstract :
Fatigue can be defined as a state that involves psychological and physical tiredness with a range of symptoms such as tired eyes, yawning and increased blink rate. It has major implications for work place and road safety as well as a negative symptom of many acute and chronic illnesses. As such there has been considerable research dedicated to systems or algorithms that can be used to detect and monitor the onset of fatigue. This paper examines using electroencephalography (EEG) signals to classify fatigue and alert states as a function of subjective self-report, driving performance and physiological symptoms. The results show that EEG classification network for fatigue improved from 75% to 80% when these factors are applied, especially when the data is grouped by subjective self-report of fatigue with classification accuracy improving to 84.5%.
Keywords :
biomechanics; electroencephalography; eye; fatigue; medical signal detection; medical signal processing; signal classification; EEG; blink rate; brain activity; classification rates; electroencephalography; fatigue countermeasure devices; physical tiredness; psychological tiredness; tired eyes; yawning; Artificial neural networks; Biomedical monitoring; Brain modeling; Driver circuits; Electroencephalography; Fatigue; Psychology; Algorithms; Automobile Driving; Brain Mapping; Electroencephalography; Fatigue; Humans; Reproducibility of Results; Sensitivity and Specificity; Task Performance and Analysis; Technology Assessment, Biomedical;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4123-5
Type :
conf
DOI :
10.1109/IEMBS.2010.5625964
Filename :
5625964
Link To Document :
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