Title :
Iterative learning control of bead morphology in Laser Metal Deposition processes
Author :
Sammons, Patrick M. ; Bristow, Douglas A. ; Landers, Robert G.
Author_Institution :
Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
Laser Metal Deposition (LMD) is a layer-based manufacturing process in which a laser and powdered metal are used to create a molten bead that is then traced along a path to create functional parts. The properties of the structure, including shape and material microstructure, are the result of complex interactions between the laser, the powder, the part substrate and other factors. Thus, a control algorithm is needed to accurately produce the designed part. However, feedback control of the process can create phase lag in the resulting control structure, which in turn can create dimensional instability. Additionally, the LMD process has been shown to change with part height or layer number. Taking these issues into account, a feed-forward, adaptive-type controller that changes with each fabricated layer, should be used. This paper first presents a dynamic model for the LMD process that incorporates the dependency of the process on part height. Then, an optimal Iterative Learning Process Control algorithm is presented to regulate the melt pool morphology of a deposited part using layer number as the iteration axis. A simulation study on the LMD process using the designed process controller shows that it is able to achieve good tracking performance.
Keywords :
adaptive control; control system synthesis; crystal microstructure; feedback; laser deposition; layered manufacturing; optimal control; process control; LMD process; bead morphology; feed-forward adaptive-type controller; feedback control; iteration axis; laser metal deposition processes; layer-based manufacturing process; material microstructure; melt pool morphology; optimal iterative learning process control algorithm; process controller; tracking performance; Equations; Mathematical model; Metals; Process control; Solids; Trajectory;
Conference_Titel :
American Control Conference (ACC), 2013
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4799-0177-7
DOI :
10.1109/ACC.2013.6580770