DocumentCode :
2916105
Title :
An investigation on ADC testing using digital modelling
Author :
Hon, Leong Mun ; A´ain, Abu Khari Bin
Author_Institution :
Electron. Eng. Dept., Univ. Teknologi Malaysia, Johor, Malaysia
Volume :
D
fYear :
2004
fDate :
21-24 Nov. 2004
Firstpage :
245
Abstract :
This paper presents an analysis of test results of digital model approach on Analogue-to-digital converter (ADC). The approach is to inject primary input with arbitrary frequencies and periodical digital pulse. The output response is sampled and analysed in order to distinguish between GO or No-GO. Furthermore, the proposed technique is also coupled with power supply voltage control test technique to investigate the fault coverage margin. Histogram test, conventional industrial test technique, simulates concurrently were also employed as a comparison study.
Keywords :
analogue-digital conversion; digital simulation; power supply circuits; voltage control; ADC; analogue-to-digital converter; arbitrary frequencies; digital modelling; fault coverage margin; histogram test; mixed mode test; periodical digital pulse; power supply voltage control test; pulse stimulus; unify circuit test; CMOS logic circuits; CMOS process; CMOS technology; Circuit faults; Circuit testing; Electronic equipment testing; Histograms; Pulsed power supplies; Semiconductor device modeling; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2004. 2004 IEEE Region 10 Conference
Print_ISBN :
0-7803-8560-8
Type :
conf
DOI :
10.1109/TENCON.2004.1414915
Filename :
1414915
Link To Document :
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