Title :
Experimental verification of high speed AFM through local raster scanning
Author :
Peng Huang ; Andersson, Sean B.
Author_Institution :
Dept. of Mech. Eng., Boston Univ., Boston, MA, USA
Abstract :
Local raster scanning is an algorithm for using the data acquired by an atomic force microscope in real time to steer the tip so that it stays on a sample of interest. The algorithm is suitable for all samples that are “string-like” in nature and has been shown through simulation and experiment to produce an order-of-magnitude improvement in imaging rate. This paper presents experiment results of applying the algorithm to gratings, demonstrating this improvement in speed. We compare the results to standard raster-scanning and discuss challenges introduced by our approach.
Keywords :
atomic force microscopy; biology; atomic force microscope; experimental verification; high speed AFM; local raster scanning; order-of-magnitude improvement; Detectors; Field programmable gate arrays; Gratings; Image edge detection; Imaging; Standards; Trajectory;
Conference_Titel :
American Control Conference (ACC), 2013
Conference_Location :
Washington, DC
Print_ISBN :
978-1-4799-0177-7
DOI :
10.1109/ACC.2013.6580786
