DocumentCode :
2916289
Title :
CMOS resonant beam gas sensing system with on-chip self excitation
Author :
Lange, D. ; Hagleitner, C. ; Brand, O. ; Baltes, H.
Author_Institution :
Lab. of Phys. Electron., Eidgenossische Tech. Hochschule, Zurich, Switzerland
fYear :
2001
fDate :
25-25 Jan. 2001
Firstpage :
547
Lastpage :
552
Abstract :
We present a single-chip CMOS resonant beam gas sensing system with on-chip self excitation for the detection of volatile organic compounds (VOC). For the first time, a mass-sensitive resonant cantilever is cointegrated with a feedback circuit yielding a sensor system operating in a self-excitation mode. Analyte gases are absorbed by a sensitive layer deposited on the cantilever. The corresponding mass increase leads to a decrease of the beam´s resonance frequency. In this way, concentrations of various VOC´s in synthetic air are measured. The influence of polymer thickness on resonance frequency, quality factor, and vibration amplitude is investigated. The frequency stability and sensitivity of the cantilever sensor is tested and an optimal polymer thickness of 3-4 pm determined. A limit of detection of 0.8 ppm for octane is calculated. This corresponds to a mass resolution of less than 0.4 pg. The on-chip integration of the feedback circuit makes it possible to abandon external driving circuitry. Thus, it drastically reduces the system size and number of components, and facilitates mass production.
Keywords :
CMOS integrated circuits; circuit feedback; gas sensors; microsensors; organic compounds; feedback circuit; frequency stability; mass production; mass sensitivity; nonmechanical cantilever; octane; on-chip self-excitation; polymer coating; quality factor; resonance frequency; single chip CMOS resonant beam gas sensor; vibration amplitude; volatile organic compound detection; Feedback circuits; Gas detectors; Gases; Polymers; Q factor; Resonance; Resonant frequency; Sensor systems; System-on-a-chip; Volatile organic compounds;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2001. MEMS 2001. The 14th IEEE International Conference on
Conference_Location :
Interlaken, Switzerland
ISSN :
1084-6999
Print_ISBN :
0-7803-5998-4
Type :
conf
DOI :
10.1109/MEMSYS.2001.906600
Filename :
906600
Link To Document :
بازگشت