DocumentCode :
2916313
Title :
Compensating mismatch in a dedicated pixel array for moving edge detection
Author :
Boonsobhak, Vasin ; Cameron, Katherine ; Renshaw, David ; Murray, A.
Author_Institution :
Sch. of Eng. & Electron., Edinburgh Univ., UK
Volume :
D
fYear :
2004
fDate :
21-24 Nov. 2004
Firstpage :
278
Abstract :
This paper describes the implementation of a CMOS edge-detecting pixel array with on-chip adaptation that compensates for intrinsic variation between devices. The adaptation algorithm, based on asymmetric Hebbian training, uses spike timing to adapt out the effects of device mismatch and process variation. Each pixel adapts to background illuminance and provides high-pass filtering output with respect to local positive and negative illuminance transients. Sample chips have been manufactured using a 0.35 μm CMOS technology, and the test results confirming the feasibility of the chosen approach are reported.
Keywords :
CMOS integrated circuits; Hebbian learning; edge detection; high-pass filters; lighting; power engineering computing; 0.35 micron; CMOS edge-detecting pixel array; adaptation algorithm; asymmetric Hebbian training; background illuminance; compensating mismatch; device mismatch; high-pass filtering; intrinsic variation; on-chip adaptation; spike timing; Image edge detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
TENCON 2004. 2004 IEEE Region 10 Conference
Print_ISBN :
0-7803-8560-8
Type :
conf
DOI :
10.1109/TENCON.2004.1414923
Filename :
1414923
Link To Document :
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