DocumentCode :
2916429
Title :
Pulse and DC operation lifetimes of bent-beam electrothermal actuators
Author :
Que, L. ; Otradovec, L. ; Oliver, A.D. ; Gianchandani, Y.B.
Author_Institution :
Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
fYear :
2001
fDate :
25-25 Jan. 2001
Firstpage :
570
Lastpage :
573
Abstract :
This paper reports on lifetime studies of polysilicon and p/sup ++/ Si electrothermal actuators designed for rectilinear displacements. Measurements show that degradation patterns for displacement amplitude can be linked to design variables and operating conditions. At low power levels (which result in average operating temperatures of 300-400/spl deg/C), both types of devices provide continuous DC actuation for >1400 min. and pulse actuation for >30 million cycles without change in amplitude. A model similar to that used for fatigue in steel is used to fit pulse test data for p/sup ++/ Si actuators. The model parameters are explored as functions of operating conditions and device geometry.
Keywords :
electric actuators; elemental semiconductors; microactuators; silicon; 300 to 400 C; DC operation lifetime; Si; bent-beam electrothermal actuator; failure model; p/sup ++/-Si single crystal; polysilicon wafer; pulse operation lifetime; rectilinear displacement; Actuators; Degradation; Displacement measurement; Electrothermal effects; Fatigue; Geometry; Solid modeling; Steel; Temperature; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2001. MEMS 2001. The 14th IEEE International Conference on
Conference_Location :
Interlaken, Switzerland
ISSN :
1084-6999
Print_ISBN :
0-7803-5998-4
Type :
conf
DOI :
10.1109/MEMSYS.2001.906605
Filename :
906605
Link To Document :
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