DocumentCode :
2916471
Title :
MEMS infrared gas spectrometer based on a porous silicon tunable filter
Author :
Lammel, G. ; Schweizer, S. ; Renaud, P.
Author_Institution :
Inst. of Microsystems IMS, Swiss Federal Inst. of Technol., Lausanne, Switzerland
fYear :
2001
fDate :
25-25 Jan. 2001
Firstpage :
578
Lastpage :
581
Abstract :
We present a MEMS infrared spectrometer for selective and quantitative chemical gas analysis. Infrared absorption spectroscopy can distinguish gases easily and also detect nonreactive molecules like CO/sub 2/, in contrast to e.g. metal oxide gas sensors. The following new spectrometer concept avoids expensive linear detectors as used for grating spectrometers: A tunable interference filter scans the desired part of the infrared spectrum. A single pixel thermopile detector measures serially the intensify at selected wavelengths. The tunable optical interference filter is fabricated by a new porous silicon batch technology using only two photolithography steps. The refractive index of this filter microplate is gradually modulated in depth to create a Bragg mirror, edge filter or a Fabry-Perot bandpass filter for central wavelengths between 400 nm and 8 /spl mu/m. Two thermal bimorph micro-actuators tilt the plate by up to 90/spl deg/, changing the incidence angle of the beam to be analyzed. This tunes the wavelength transmitted to the detector. The filter area can be chosen between 0.27 mm/spl times/0.70 mm and 2.50 mm/spl times/3.00 mm, its thickness is typically 30 /spl mu/m. The spectral finesse /spl lambda///spl Delta//spl lambda/ of 25 is sufficient for most diagnosis applications. First results showed that CO/sub 2/ and CO can be detected selectively with this system-which is interesting in combustion processes-by measuring their absorption at 4.26 /spl mu/m and 4.65 /spl mu/m respectively. Other wavelength ranges e.g. for liquid analysis or colorimetry of visible light are possible.
Keywords :
elemental semiconductors; gas sensors; infrared spectrometers; interference filters; micro-optics; optical tuning; porous semiconductors; silicon; spectrochemical analysis; 400 nm to 8 micron; Bragg mirror; CO; CO detection; CO/sub 2/; CO/sub 2/ detection; Fabry-Perot bandpass filter; MEMS infrared spectrometer; Si; batch fabrication; chemical gas analysis; combustion; edge filter; infrared absorption spectroscopy; liquid analysis; microplate; photolithography; porous silicon tunable interference filter; refractive index; thermal bimorph microactuator; thermopile detector; visible light colorimetry; Band pass filters; Chemical analysis; Electromagnetic wave absorption; Gas detectors; Infrared detectors; Infrared spectra; Micromechanical devices; Optical filters; Silicon; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2001. MEMS 2001. The 14th IEEE International Conference on
Conference_Location :
Interlaken, Switzerland
ISSN :
1084-6999
Print_ISBN :
0-7803-5998-4
Type :
conf
DOI :
10.1109/MEMSYS.2001.906607
Filename :
906607
Link To Document :
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