DocumentCode :
2917103
Title :
Single monolayer nanocrystal LED on probe tip for near-field molecular imaging and patterning
Author :
Hoshino, K. ; Gopal, A. ; Ostrowski, D. ; Rozanski, L. ; Patel, R. ; Heitsch, A. ; Korgel, B. ; VandenBout, D. ; Zhang, X.J.
Author_Institution :
Univ. of Texas at Austin, Austin
fYear :
2008
fDate :
13-17 Jan. 2008
Firstpage :
128
Lastpage :
131
Abstract :
We report a novel light emitting nano-diode structure consisting of a single monolayer of CdSe nanocrystals deposited on a scanning probe tip for near-field scanning optical microscopy (NSOM). P-doped silicon which forms the probe body was utilized as an anode of the LED. A Langmuir-Blodgett (LB) trough was used to deposit on-probe a monolayer of nanocrystals (5-10 nm thickness), which were then examined with a SEM/TEM to show uniform deposition, and a fluorescent microscope to demonstrate light emitting properties. Both photoluminescent and electroluminescent emissions were observed from the fabricated probe with monolayer LED. Preliminary imaging and patterning using functional light emitting silicon probes were demonstrated in a standard NSOM setup. Resolutions of 50 nm and 400 nm were acquired for topographic and optical imaging, respectively.
Keywords :
Langmuir-Blodgett films; cadmium compounds; monolayers; nanopatterning; nanostructured materials; near-field scanning optical microscopy; organic light emitting diodes; probes; silicon; CdSe; Langmuir-Blodgett trough; NSOM; electroluminescent emission; fluorescent microscope; functional light emitting silicon probes; light emitting nanodiode structure; nanopatterning; near-field molecular imaging; near-field scanning optical microscopy; organic light emitting diodes; photoluminescent emission; scanning probe tip; single monolayer nanocrystal LED; size 5 nm to 10 nm; Light emitting diodes; Molecular imaging; Nanocrystals; Nanostructures; Optical imaging; Optical microscopy; Probes; Scanning electron microscopy; Silicon; Transmission electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
Conference_Location :
Tucson, AZ
ISSN :
1084-6999
Print_ISBN :
978-1-4244-1792-6
Electronic_ISBN :
1084-6999
Type :
conf
DOI :
10.1109/MEMSYS.2008.4443609
Filename :
4443609
Link To Document :
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