Title :
A Low Overhead and High Coverage BIST Scheme for Dynamic CMOS PLAs
Author :
Renovell, M. ; Ildevert, M. ; Bertrand, Y.
Author_Institution :
Universite de Montpelier II: Sciences et Techniques du Languedoc
Keywords :
Built-in self-test; Circuit faults; Circuit testing; Delay; IEEE members; Logic testing; Performance evaluation; Programmable logic arrays; Robots; Semiconductor device modeling;
Conference_Titel :
VLSI Design, 1992. Proceedings., The Fifth International Conference on
Print_ISBN :
0-8186-2465-5
DOI :
10.1109/ICVD.1992.658083
