DocumentCode
2917211
Title
Jitter characterization of incoherently sub-sampled high-speed digital signals
Author
Choi, Hyun ; Chatterjee, Abhijit
Author_Institution
Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fYear
2010
fDate
7-9 June 2010
Firstpage
1
Lastpage
5
Abstract
A jitter characterization approach for incoherently sub-sampled high-speed digital signals using back-end signal processing algorithms is presented. Signal sub-sampling is used to increase the effective sampling rate of the digitizer used for data acquisition while incoherent sampling is utilized to simplify the data acquisition hardware. Algorithms for signal clock recovery and waveform reconstruction from the acquired data are developed in this research. The algorithms utilize peak identification of the sampled signal spectrum and the sparsity of the reconstructed waveform in the frequency domain as decision criteria for accurate signal reconstruction. To quantize the jitter value of such a reconstructed waveform, a wavelet based denoising method is used to generate a self-reference signal against which zero-crossing times are compared to generate jitter statistics. In addition, the data dependent jitter components can be differentiated from the original jitter by analyzing zero-crossing discrepancies of the self-reference signal.
Keywords
jitter; signal sampling; back-end signal processing algorithm; data acquisition hardware; data dependent jitter component; decision criteria; digitizer; frequency domain; incoherent sampling; incoherently sub-sampled high speed digital signal; jitter characterization; jitter statistics; reconstructed waveform; sampled signal spectrum; sampling rate; self-reference signal; signal clock recovery; signal reconstruction; signal sub-sampling; waveform reconstruction; wavelet based denoising method; Clocks; Data acquisition; Frequency domain analysis; Hardware; Jitter; Signal generators; Signal processing; Signal processing algorithms; Signal reconstruction; Signal sampling;
fLanguage
English
Publisher
ieee
Conference_Titel
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2010 IEEE 16th International
Conference_Location
La Grande Motte
Print_ISBN
978-1-4244-7792-0
Electronic_ISBN
978-1-4244-7791-3
Type
conf
DOI
10.1109/IMS3TW.2010.5502993
Filename
5502993
Link To Document