• DocumentCode
    2917211
  • Title

    Jitter characterization of incoherently sub-sampled high-speed digital signals

  • Author

    Choi, Hyun ; Chatterjee, Abhijit

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • fYear
    2010
  • fDate
    7-9 June 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    A jitter characterization approach for incoherently sub-sampled high-speed digital signals using back-end signal processing algorithms is presented. Signal sub-sampling is used to increase the effective sampling rate of the digitizer used for data acquisition while incoherent sampling is utilized to simplify the data acquisition hardware. Algorithms for signal clock recovery and waveform reconstruction from the acquired data are developed in this research. The algorithms utilize peak identification of the sampled signal spectrum and the sparsity of the reconstructed waveform in the frequency domain as decision criteria for accurate signal reconstruction. To quantize the jitter value of such a reconstructed waveform, a wavelet based denoising method is used to generate a self-reference signal against which zero-crossing times are compared to generate jitter statistics. In addition, the data dependent jitter components can be differentiated from the original jitter by analyzing zero-crossing discrepancies of the self-reference signal.
  • Keywords
    jitter; signal sampling; back-end signal processing algorithm; data acquisition hardware; data dependent jitter component; decision criteria; digitizer; frequency domain; incoherent sampling; incoherently sub-sampled high speed digital signal; jitter characterization; jitter statistics; reconstructed waveform; sampled signal spectrum; sampling rate; self-reference signal; signal clock recovery; signal reconstruction; signal sub-sampling; waveform reconstruction; wavelet based denoising method; Clocks; Data acquisition; Frequency domain analysis; Hardware; Jitter; Signal generators; Signal processing; Signal processing algorithms; Signal reconstruction; Signal sampling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2010 IEEE 16th International
  • Conference_Location
    La Grande Motte
  • Print_ISBN
    978-1-4244-7792-0
  • Electronic_ISBN
    978-1-4244-7791-3
  • Type

    conf

  • DOI
    10.1109/IMS3TW.2010.5502993
  • Filename
    5502993