Title :
A comparison between voltage and true power based embedded measurements for RF testing
Author :
Mota, Pedro ; Da Silva, José Machado
Author_Institution :
Fac. de Eng., Univ. do Porto, Porto, Portugal
Abstract :
Peak voltage sensors, namely diode based detectors, have been used for in-circuit testing of RF circuits. These detectors are simple to implement but provide a limited accuracy. On the other hand, the power inferred from these measurements assumes that impedance is known. This work presents a comparison between measurements obtained with peak voltage and true power detectors. The trade-off between observing one and the other are discussed, namely as far as information concerning the output load is concerned. Simulation results, acquired with the model of a prototype demonstration chip, show that more accurate information is obtained with power rather than voltage measurements in case load impedance variations occur. Experimental results obtained with a prototype chip are currently being obtained.
Keywords :
circuit testing; peak detectors; power measurement; sensors; voltage measurement; RF circuit testing; diode based detectors; load impedance variations; peak voltage detector; peak voltage sensors; true power based embedded measurements; true power detectors; voltage embedded measurements; Circuit testing; Detectors; Diodes; Impedance measurement; Power measurement; Prototypes; Radio frequency; Semiconductor device measurement; Virtual prototyping; Voltage measurement;
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2010 IEEE 16th International
Conference_Location :
La Grande Motte
Print_ISBN :
978-1-4244-7792-0
Electronic_ISBN :
978-1-4244-7791-3
DOI :
10.1109/IMS3TW.2010.5503003