• DocumentCode
    2917454
  • Title

    Improved method for SNR prediction in machine-learning-based test

  • Author

    Sheng, Xiaoqin ; Kerkhoff, Hans G.

  • Author_Institution
    CTIT-TDT Group, Univ. of Twente, Enschede, Netherlands
  • fYear
    2010
  • fDate
    7-9 June 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper applies an improved method for testing the signal-to-noise ratio (SNR) of Analogue-to-Digital Converters (ADC). In previous work, a noisy and nonlinear pulse signal is exploited as the input stimulus to obtain the signature results of ADC. By applying a machine-learning-based approach, the dynamic parameters can be predicted by using the signature results. However, it can only estimate the SNR accurately within a certain range. In order to overcome this limitation, an improved method based on work is applied in this work. It is validated on the Labview model of a 12-bit 80 Ms/s pipelined ADC with a pulse- wave input signal of 3 LSB noise and 7-bit nonlinear rising and falling edges.
  • Keywords
    analogue-digital conversion; learning (artificial intelligence); Labview model; SNR prediction; analogue-to-digital converter; machine-learning-based test; pulse-wave input signal; signal-to-noise ratio; Circuit noise; Circuit testing; Mars; Multimedia systems; RF signals; Radio frequency; Signal generators; Signal to noise ratio; System testing; Training data; ADC; SNR; double-ADC; machine-learning-based; pulse wave; test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2010 IEEE 16th International
  • Conference_Location
    La Grande Motte
  • Print_ISBN
    978-1-4244-7792-0
  • Electronic_ISBN
    978-1-4244-7791-3
  • Type

    conf

  • DOI
    10.1109/IMS3TW.2010.5503007
  • Filename
    5503007