DocumentCode :
2917470
Title :
Dependable digitally-assisted mixed-signal IPs based on integrated self-test & self-calibration
Author :
Kerkhoff, Hans G. ; Wan, Jinbo
Author_Institution :
Testable Design & Test of Integrated Syst. (TDT) Group, Univ. of Twente, Enschede, Netherlands
fYear :
2010
fDate :
7-9 June 2010
Firstpage :
1
Lastpage :
6
Abstract :
Heterogeneous SoC devices, including sensors, analogue and mixed-signal front-end circuits and the availability of massive digital processing capability, are being increasingly used in safety-critical applications like in the automotive, medical, and the security arena. Already a significant amount of attention has been paid in literature with respect to the dependability of the digital parts in heterogeneous SoCs. This is in contrast to especially the sensors and front-end mixed-signal electronics; these are however particular sensitive to external influences over time and hence determining their dependability. This paper provides an integrated SoC/IP approach to enhance the dependability. It will give an example of a digitally-assisted mixed-signal front-end IP which is being evaluated under its mission profile of an automotive tyre pressure monitoring system. It will be shown how internal monitoring and digitally-controlled adaptation by using embedded processors can help in terms of improving the dependability of this mixed-signal part under harsh conditions for a long time.
Keywords :
calibration; industrial property; integrated circuit reliability; integrated circuit testing; system-on-chip; analogue circuits; automotive tyre pressure monitoring system; dependable digitally-assisted mixed-signal IP; embedded processors; front-end mixed-signal electronics; heterogeneous SoC devices; integrated SoC/IP approach; integrated self-calibration; integrated self-test; massive digital processing; mixed-signal front-end circuits; sensors; Aging; Automatic testing; Automotive engineering; Availability; Built-in self-test; Circuit testing; Medical tests; Safety; System testing; Tires; aging; availability; dependability; mixedsignal testing; reliability; safety; self-calibration; self-repair; self-test;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2010 IEEE 16th International
Conference_Location :
La Grande Motte
Print_ISBN :
978-1-4244-7792-0
Electronic_ISBN :
978-1-4244-7791-3
Type :
conf
DOI :
10.1109/IMS3TW.2010.5503008
Filename :
5503008
Link To Document :
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