Abstract :
The following topics are dealt with: PLL; MEMS devices; BIST; ADC; fault detection; online diagnosis; converter testing; virtual testing; mixed-signal test automation; PV cell testing; MEMS fabrication; RFID testing; RF testing; microfluidic; self-trimming; high-speed signal testing; and analog test signal generation.
Keywords :
analogue-digital conversion; automatic testing; built-in self test; circuit testing; microfabrication; micromechanical devices; phase locked loops; signal generators; ADC; BIST; MEMS devices; MEMS fabrication; PLL; PV cell testing; RF testing; RFID testing; analog test signal generation; analogue-digital conversion; converter testing; fault detection; high-speed signal testing; microfluidic; mixed-signal test automation; online diagnosis; self-trimming; virtual testing;
Conference_Titel :
Mixed-Signals, Sensors and Systems Test Workshop (IMS3TW), 2010 IEEE 16th International
Conference_Location :
La Grande Motte
Print_ISBN :
978-1-4244-7792-0
Electronic_ISBN :
978-1-4244-7791-3
DOI :
10.1109/IMS3TW.2010.5503017
