Title : 
A self-adaptive fluidic probe for electrical caries detection
         
        
            Author : 
Chang, S.-H. ; Su, Y.-C.
         
        
            Author_Institution : 
Nat. Tsing Hua Univ., Tsing Hua
         
        
        
        
        
        
            Abstract : 
This paper presents a fiuidic probe that can self-adapt its shape to teeth and detect dental caries by sensing the variation in electrical-impedance. The fiuidic probe, whose liquid tip spontaneously spreads on hydrophilic tooth surface and into underlying caries, is employed to create intimate contact for impedance sensing. A tubular air sleeve shaped by the probe casing is applied around the liquid tip to insulate it from surrounding saliva, and to regulate its spreading. In the prototype demonstration, un-restored, extracted premolar teeth were investigated and the results indicated >20-fold impedance differences between sound and carious teeth, by which caries can be identified in a consistent manner. Furthermore, the fluidic probe has been successfully applied to approximal caries, which is difficult to detect by most existing schemes.
         
        
            Keywords : 
bioMEMS; bioelectric phenomena; biomedical measurement; dentistry; diseases; electrical contacts; microfluidics; patient diagnosis; probes; dental caries detection; electrical caries detection; electrical contact; electrical-impedance sensing; miniature liquid tip; premolar teeth; self-adaptive fluidic probe; tubular air sleeve; Application software; Contacts; Costs; Dentistry; Dielectric liquids; Diseases; Insulation; Probes; Surface impedance; Teeth;
         
        
        
        
            Conference_Titel : 
Micro Electro Mechanical Systems, 2008. MEMS 2008. IEEE 21st International Conference on
         
        
            Conference_Location : 
Tucson, AZ
         
        
        
            Print_ISBN : 
978-1-4244-1792-6
         
        
            Electronic_ISBN : 
1084-6999
         
        
        
            DOI : 
10.1109/MEMSYS.2008.4443639