Title :
Cardiovascular risk and status assessment
Author :
Paredes, S. ; Rocha, T. ; de Carvalho, P. ; Henriques, J. ; Harris, M. ; Morais, J.
Author_Institution :
Dept. de Eng., Inf. e de Sist., Inst. Politec. de Coimbra, Coimbra, Portugal
fDate :
Aug. 31 2010-Sept. 4 2010
Abstract :
This work focuses on the development of models to support the assessment of a patient´s global cardiovascular condition. Three types of models, based on different types of information, have been developed: long term cardiovascular risk models, that evaluate the risk of occurring of cardiovascular event within a long period of time (years); short term cardiovascular risk models, to assess the risk of death within a short period of time (months); cardiovascular status assessment models, to estimate the current cardiovascular condition of a patient. Three major drawbacks of current cardiovascular tools are addressed: reduced number of risk factors considered by each individual tool, inappropriateness of these tools to incorporate empirical clinical expertise and incapacity of these tools to deal with incomplete information. Methodologies and preliminary results, obtained under FP7 HeartCycle project, as well as future directions of research are also presented in this paper.
Keywords :
cardiovascular system; diseases; medical diagnostic computing; patient diagnosis; patient monitoring; risk management; FP7 HeartCycle project; cardiovascular risk assessment; current cardiovascular condition; long term cardiovascular risk model; short term cardiovascular risk model; Artificial neural networks; Biological system modeling; Cardiology; Hafnium; Heart rate; Knowledge engineering; Robustness; Algorithms; Biological Markers; Biomedical Engineering; Blood Pressure; Cardiovascular Diseases; Electrocardiography; Female; Humans; Male; Models, Cardiovascular; Models, Theoretical; Oxygen; Probability; Risk; Risk Assessment; Risk Factors;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4244-4123-5
DOI :
10.1109/IEMBS.2010.5626069